In
Intel's latest Pentium chip, wires are 15 microns in diameter and the
next generation will only be smaller. The techniques presently employed
in industry for failure analysis (focused ion beam) are losing effectiveness
and new techniques are needed for this discipline. It is our mission
to develop the next generation of fault injection in VLSI systems.
For more information about this site, contact sewardm@ele.uri.edu.
University of Rhode Island, Kingston, Rhode Island 02881
URL: http://www.ele.uri.edu/Research/nano/mission