| Syllabus Spring 2001 |
| Lecture: |
MW 7:30-8:45 Class room 1 ON Semiconductor
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Text: | Burns and Roberts, An Introduction to Mixed-Signal IC Test and Measurement, Oxford University Press, ISBN 0195140168 |
| Instructor: |
J. C. Daly Rm A120 Kelley-Annex, Tel 874-5844
daly@ele.uri.edu (email read often) Office hours TR 9:30-10:45 Other times by appointment (Send email)
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| 1 | Test Specification | 1/29 | 2.8, 2.9, 2.12, 2.13 | Ammeter Simulation | |
| 2 | DC Measurements | 2/5 | 3.12, 3.17, 3.21 | ||
| 3 | Measurement Accuracy | 2/12 | 4.2, 4.10, 4.12 | ||
| 4 | Tester Hardware | 2/19 | 5.2, 5.4, 5.14 | ||
| 5 | Sampling Theory | 2/26 | 6.1, 6.2, 6.4 | ||
| 6 | DSP Based Testing | 3/7 | 6.8, 6.11, 6.22 | Run fftdemo in MATLAB | |
| 7 | Analog Channel Testing | 4/2 | 8.1, 8.2, 8.7 | Amplifier Test | |
| 8 | Sampled Channel Testing | 4/12 | Assignment 8 | ||
| 9 | Sampled Channel Testing | 4/23 | Assignment 9 | ||
| 10 | Sampled Channel Testing | 4/30 | 9.4, 9.6, 9.7 | ||
Grades
Mid Term Exam 35% Final 45% Virtual Lab 10% Homework 10%