ELE 541
Electronic Testing II
Physics
and
Instruments
Spring 2005
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ELE541 Electronic Testing II: Physics and Instruments (4 credits)
Spring 2005
TR 11:00-12:15 AM. Kelley 203
Text: Burns and Roberts, An Introduction to Mixed-Signal IC Test and
Mesurement,
Oxford University Press, ISBN 0-19-514016-8
Introduction
Advanced topics in electronic testing. Chip structures, current testing, thermal testing, unpowered testing, low voltage testing, noise, test synthesis, bench testing
and automated test equipment (ATE).
Syllabus
Homework Solutions
Mail can be sent to
daly@ele.uri.edu
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